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ECLASS BASIC 12.0 (cn)
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- 27 电气、自动化和过程控制技术
- 27-15 分析法,电器
- 27-15-01 气体分析仪器(专利)
- 27-15-02 流体分析仪器(专利)
- 27-15-03 光度计,色散光度计,衍射(专利)
- 27-15-04 折射计,偏光计(专利)
- 27-15-05 质谱仪(MS,专利)
- 27-15-06 色谱仪,分离技术(GC,LC,专利)
- 27-15-07 PH值,氧化还原,传导率(专利)
- 27-15-08 PH值氧化还原条件用电化学传感器(专利)
- 27-15-09 材料相关辅助反应测量系统(专利)
- 27-15-10 氢焰离子化测定仪,总有机碳,丙二胺(专利)
- 27-15-11 湿度测量(非辐射测量,专利)
- 27-15-12 放射性测量(专利)
- 27-15-13 热量计,外部监控器(专利)
- 27-15-14 粘度计(专利)
- 27-15-15 导热性(专利)
- 27-15-16 声音,超声波测量(专利)
- 27-15-17 张力计(专利)
- 27-15-18 静电学,摩擦学灰尘测量(专利)
- 27-15-90 分析技术,分析仪器(其它)
Classification: 27150000 [AAB951009]
Preferred name | 27-15 分析法,电器 |
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Definition | Devices and technology for systematical measurement, fragmentation, examination and analysis of objects without neglecting the intertwining and integration of the singular analysed elements. It can be differentiated between qualitative, quantitative analysis methods for the clearance or identification of the structure within the various scientific areas. Main group 27150000 is divided into devices for analysis for the measurement of various physical sizes as well as the resulting measurements and complex attachments for the structure analysis of the materials. Further division is by systems, parts, components, maintenance, inspection and service of the analytic devices |
IRDI | 0173-1#01-AAB951#009 |
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