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ECLASS BASIC 13.0 (en)
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- 27 Electric engineering, automation, process control engineering
- 27-15 Analysis technology, device
- 27-15-01 Paramagnetism, O2 measuring (PAT)
- 27-15-02 Fluid analysis appliance
- 27-15-03 Photometer, dispersion photometer, diffraction (PAT)
- 27-15-04 Refractometer, polarimeter (PAT)
- 27-15-05 Mass spectrometer (MS, PAT)
- 27-15-06 Chromatograph, separation technique (GC,LC,PAT)
- 27-15-07 PH, redox, conductivity (PAT)
- 27-15-08 Electrochemical sensor for pH, redox, conductivity (PAT)
- 27-15-09 Measuring system with material specific auxiliary reaction (PAT)
- 27-15-10 FID, TOC, TN (PAT)
- 27-15-11 Moisture measurement (non-radiometric, PAT)
- 27-15-12 Radiometry (PAT)
- 27-15-13 Calorimeter, ex-monitoring (PAT)
- 27-15-14 Viscosimeter (PAT)
- 27-15-15 Thermal conductivity (PAT)
- 27-15-16 Sound, ultrasonic level measurement (PAT)
- 27-15-17 Tensiometer (PAT)
- 27-15-18 Electrostatics, tribologic dust measurement (PAT)
- 27-15-90 Analysis technology, device (other)
Classification: 27150000 [AAB951010]
| Preferred name | 27-15 Analysis technology, device |
|---|---|
| Definition | Devices and technology for systematical measurement, fragmentation, examination and analysis of objects without neglecting the intertwining and integration of the singular analysed elements. It can be differentiated between qualitative, quantitative analysis methods for the clearance or identification of the structure within the various scientific areas. Main group 27150000 is divided into devices for analysis for the measurement of various physical sizes as well as the resulting measurements and complex attachments for the structure analysis of the materials. Further division is by systems, parts, components, maintenance, inspection and service of the analytic devices |
| IRDI | 0173-1#01-AAB951#010 |
| | |